A Test Pattern Generation System on a CAD Workstation

Pan Yuqi; Zhang Baoding; Li Zhongcheng; Li Jintao; Min Yinghua

Pan Yuqi, Zhang Baoding, Li Zhongcheng, Li Jintao, Min Yinghua. A Test Pattern Generation System on a CAD WorkstationJ. Journal of Computer-Aided Design & Computer Graphics, 1992, 4(2): 1-7.

Citation:

Pan Yuqi, Zhang Baoding, Li Zhongcheng, Li Jintao, Min Yinghua. A Test Pattern Generation System on a CAD WorkstationJ. Journal of Computer-Aided Design & Computer Graphics, 1992, 4(2): 1-7.

Citation:

Pan Yuqi, Zhang Baoding, Li Zhongcheng, Li Jintao, Min Yinghua. A Test Pattern Generation System on a CAD WorkstationJ. Journal of Computer-Aided Design & Computer Graphics, 1992, 4(2): 1-7.

A Test Pattern Generation System on a CAD Workstation

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This paper presents a test pattern generation system implemented on a CAD workstation. Based on FAN algorithm and the structural analysis of the tested circuit, the system generates the test pattesrns for combinational circuite automatically. The fault coverage for combinational circuits can be reached more than 95%.

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A Test Pattern Generation System on a CAD Workstation

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