A STRATEGY FOR WHOLE MACHINE BEHAVIORAL FUNCTIONAL LEVEL SIMULATION OF MB86901 SPARC RISC CHIP

This paper describes an approach to instruction system-based on behavioral functional level test of MB86901 SPARC RISC chip. The test steps are given as follow: fust, the special purpose registers and register files are tested; second, the individual instructions, and finally the possible relationship between instructions are also tested. The Reed Muller codes are used to test registers. A random number generator is presented while testing the A/L/S instructions.