Zeng Shan, Yu Wenjian, Du Yu, Hong Xianlong, Wang Zeyi. The Proof of the Stability of Circuit Simulation Based on the K MethodJ. Journal of Computer-Aided Design & Computer Graphics, 2007, 19(12): 1517-1521.
Citation:
Zeng Shan, Yu Wenjian, Du Yu, Hong Xianlong, Wang Zeyi. The Proof of the Stability of Circuit Simulation Based on the K MethodJ. Journal of Computer-Aided Design & Computer Graphics, 2007, 19(12): 1517-1521.
Zeng Shan, Yu Wenjian, Du Yu, Hong Xianlong, Wang Zeyi. The Proof of the Stability of Circuit Simulation Based on the K MethodJ. Journal of Computer-Aided Design & Computer Graphics, 2007, 19(12): 1517-1521.
Citation:
Zeng Shan, Yu Wenjian, Du Yu, Hong Xianlong, Wang Zeyi. The Proof of the Stability of Circuit Simulation Based on the K MethodJ. Journal of Computer-Aided Design & Computer Graphics, 2007, 19(12): 1517-1521.
The Proof of the Stability of Circuit Simulation Based on the K Method
The window selection method proposed in （Wei Hongchuan,Yu Wenjian,Yang Liu,et al. Fast inductance and resistance extraction of 3-D VLSI interconnects based on the method of K element.Acta Electronica Sinica,2005,33（8）：1365－1369） was used in the paper.We proved based on it,the partial reluctance matrix extracted is positive definite.So the simulation based on it is stable.
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