Abstract: Based on the mixed-signal characteristics of flash memory designs，a waveform comparison method is presented for mixed-signal validation automation.A point to point comparison is used to autocheck digital signal integrity and to compare simulation waveforms.A time-shifting adjustment method is proposed to auto-detect the digital control events from MCU instructions and to perform analog wave comparisons under the control events shifting.Besides，a pattern comparison algorithm based on Wiener filter is designed to decide whether analog function is still correct under different process corners，voltages and temperatures （PVT）.The method is implemented and tested in flash memory design of Intel technology development （Shanghai） with good productivity and quality improvements.