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同步时序电路测试生成研究

STATE TEST GENERATION FOR SYNCHRONOUS CIRCUITS

  • 摘要: 本文分析了固定故障所反映出的状态变换特征,提出状态变换故障模型。基于无复位时序电路,详细研究了有复位状态的同步电路测试生成问题及在无复位电路中的应用。最后讨论了故障精简以及启发知识在测试过程中的应用

     

    Abstract: Based on the character of stuck-up fault, this paper describes state transition testing algorithm. This approach involves state transition fault model and collapsing of fault set. In order to test the circuits that has not any reset state, special way for resolving start state is described. Finally. heuristic information that used testing process are proposed

     

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