Abstract: A global test point placement algorithm──GTPP is presented in this paper. Before designing for testability, it analyzes testability of the circuit and obtains a test point candidate set TPCS, in which every node may greatly improve the testability of the circuit, GTPP gets the initial bound of global test point placement by using selective tracing. Thus GTPP converts a test point placement problem into a branch bound one, and derives a global design for testability. The GTPP method is based on SCTM.