Abstract: Based on arithmetic additive generator,we present an universal design-for-testability and test strategy for infinite impulse response （IIR） filter.The design improves the circuit testability by the aid of cutting off feedback loops in IIR filter in test mode.Reuse of some adders and registers in IIR filter design for-testability, additional hardware and area overhead are reduced.The test strategy can detect any combinational stuck-at faults within the circuit basic building cell efficiently without degradation of circuit performance.